The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes. The system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from the ST system provides a flexible tool for quality laboratories, production facilities and research departments.
Nikon Metrology X-ray sources are at the heart of our technology and have been designed and manufactured in-house from 1987 to this day; offering over 30 years of knowledge. Being at the heart of the image, control over the X-ray source technology allows Nikon Metrology to quickly move with the market and develop complete and innovative solutions to the application demand. All sources are open-tube giving a low cost of ownership and range from low 180 kV to medium 225 kV to high 450 kV, all with micron resolution.
Capabilities include:
Inspection volume
XT H 225 ST system has large inspection envelope, tilt axis and choice of X-ray s from transmission target 180 kV to high flux rotating target 22ource5 kV make the system a versatile tool for small and light to large and heavy samples in any industry.
Stunning images
High resolution voxel data is achieved in CT scans by having high resolution flat panels with many pixels in the radiograph. The ST cabinet is configurable with higher resolution 4000 x 4000 pixel flat panels.
Motorized FID
The ST cabinet can have a motorized FID that allows to move the detector closer to the source. As the X-ray intensity drops with the distance, a shorter FID (Focal spot to Imager Distance) prevents that the X-ray flux decreases. This allows shorter imager exposure and results in faster scan times. Alternatively a shorter FID can give brighter images when using low energy X-rays. Both phenomena are advantageous when high magnification is not a limiting factor.
Anywhere the internal structure matters, X-ray and CT technology serves as an efficient tool to provide valuable information. Detailed capture and measurement of internal features is vital for quality control, failure analysis and material research across various industries.
- Fault detection and failure analysis
- Assembly inspection of complex mechanisms
- Dimensional measurement of internal components
- Part-to-CAD comparison
- Advanced material research
- Analysis of the biological structures
- Digital archiving of models
With all Nikon Metrology CT systems you can
- Verify complex internal structures
- Isolate and inspect included components
- Measure internal dimensions without sectioning
- Automatically detect and measure internal voids
- Reveal internal and external surfaces with ease
- Reduce total inspection time
- Reduce number of iterations to fine-tune production parameters
Applications:
Aerospace
- Wax turbine blades
- Cast turbine blades
- Crack analysis
- Weld analysis
Automotive
- Electrical connectors
- Injection nozzles
- Sensors (e.g. Lambda sensor)
- LED light pipes
- Small high-pressure die cast parts
- DPF (Diesel Particulate Filters)
Pharmaceutical/medical
- Medicine dispensers
- Small medical devices
- Small plastic or composite parts
- Bone structures
- Implants (dental, hip, knee, skull)
Plastic injection molding
- Complex plastic components
- Soft, translucent materials where tactile or optical is no option
- Ultrasonic welding of plastic parts
Research
- Material verification and analysis (structure, porosity, defects)
- Paleontology (bones, skulls, fossils)
- Geology and soil science
- Archeology
- Renewable energy (batteries, solar cells)